OBIRCH analysis：雷射光束電阻異常偵測(OBIRCH)
雷射光束電阻異常偵測(OBIRCH)
雷射光束電阻異常偵測(OpticalBeamInducedResistanceChange，以下簡稱OBIRCH)，以雷射光在IC表面進行掃描，在IC功能測試期間，OBIRCH利用雷射掃瞄IC內部連接位置 ...。其他文章還包含有：「ElectricalFailureAnalysis(EFA)」、「OBIRCH」、「OBIRCH」、「OpticalBeamInducedResistanceChange(OBIRCH)」、「Thermallaserstimulation」、「電性故障分析(EFA)」
查看更多 離開網站雷射光束電阻異常偵測(OpticalBeamInducedResistanceChange，以下簡稱OBIRCH)，以雷射光在IC表面(正面或背面)進行掃描，在IC功能測試期間，OBIRCH利用雷射掃瞄IC內部連接位置，並產生溫度梯度，藉此產生阻值變化，並經由阻值變化的比對，定位出ICHotSpot(亮點、熱點)缺陷位置。
Electrical Failure Analysis (EFA)
https://www.matek.com
The Infrared Optical Beam Induced Resistance Change（IR OBIRCH）, is a failure analysis tool used to detect IR illumination induced resistance changes. It uses ...
OBIRCH
https://en.msscorps.com
OBIRCH Analysis detects fluctuation in electricity that occur when an infrared laser is irradiated to find leakage current paths and contact area resistance ...
OBIRCH
https://www.msscorps.com
OBIRCH Analysis detects fluctuation in electricity that occur when an infrared laser is irradiated to find leakage current paths and contact area resistance ...
Optical Beam Induced Resistance Change (OBIRCH)
https://www.istgroup.com
The Optical Beam Induced Resistance Change (OBIRCH) scans an IC surface (either front or back) with a laser beam during the IC function test period.
Thermal laser stimulation
https://en.wikipedia.org
This technique may be used for semiconductor failure analysis. There ... (OBIRCH), thermally induced voltage alteration (TIVA)), external ...
電性故障分析(EFA)
https://www.matek.com
We provide wide span of materials, structure analysis, surface analysis, failure analysis, and reliability test. ... OBIRCH. 技術原理. IR-OBIRCH 的全名為 ...