OBIRCH analysis：Optical Beam Induced Resistance Change (OBIRCH)
Optical Beam Induced Resistance Change (OBIRCH)
Electrical Failure Analysis (EFA)
https://www.matek.com
The Infrared Optical Beam Induced Resistance Change（IR OBIRCH）, is a failure analysis tool used to detect IR illumination induced resistance changes. It uses ...
OBIRCH
https://en.msscorps.com
OBIRCH Analysis detects fluctuation in electricity that occur when an infrared laser is irradiated to find leakage current paths and contact area resistance ...
OBIRCH
https://www.msscorps.com
OBIRCH Analysis detects fluctuation in electricity that occur when an infrared laser is irradiated to find leakage current paths and contact area resistance ...
Thermal laser stimulation
https://en.wikipedia.org
This technique may be used for semiconductor failure analysis. There ... (OBIRCH), thermally induced voltage alteration (TIVA)), external ...
雷射光束電阻異常偵測(OBIRCH)
https://www.istgroup.com
雷射光束電阻異常偵測(Optical Beam Induced Resistance Change，以下簡稱OBIRCH)，以雷射光在IC表面進行掃描，在IC功能測試期間，OBIRCH 利用雷射掃瞄IC 內部連接位置 ...
電性故障分析(EFA)
https://www.matek.com
We provide wide span of materials, structure analysis, surface analysis, failure analysis, and reliability test. ... OBIRCH. 技術原理. IR-OBIRCH 的全名為 ...