OBIRCH analysis：電性故障分析(EFA)
Electrical Failure Analysis (EFA)
https://www.matek.com
The Infrared Optical Beam Induced Resistance Change（IR OBIRCH）, is a failure analysis tool used to detect IR illumination induced resistance changes. It uses ...
OBIRCH
https://en.msscorps.com
OBIRCH Analysis detects fluctuation in electricity that occur when an infrared laser is irradiated to find leakage current paths and contact area resistance ...
OBIRCH
https://www.msscorps.com
OBIRCH Analysis detects fluctuation in electricity that occur when an infrared laser is irradiated to find leakage current paths and contact area resistance ...
Optical Beam Induced Resistance Change (OBIRCH)
https://www.istgroup.com
The Optical Beam Induced Resistance Change (OBIRCH) scans an IC surface (either front or back) with a laser beam during the IC function test period.
Thermal laser stimulation
https://en.wikipedia.org
This technique may be used for semiconductor failure analysis. There ... (OBIRCH), thermally induced voltage alteration (TIVA)), external ...
雷射光束電阻異常偵測(OBIRCH)
https://www.istgroup.com
雷射光束電阻異常偵測(Optical Beam Induced Resistance Change，以下簡稱OBIRCH)，以雷射光在IC表面進行掃描，在IC功能測試期間，OBIRCH 利用雷射掃瞄IC 內部連接位置 ...